9.2.2.2. Field-Effect Transistors
Table of Contents
Basic idea
A field effect transistor, or FET, is a transistor in which an electric field controls the flow of charge through a material channel. Unlike a bipolar junction transistor, which uses both electrons and holes in its operation, a FET is usually described as a voltage controlled device. A voltage applied at one terminal changes how easily current can pass between two other terminals.
The three main terminals of a FET are called the source, the drain, and the gate. Charge carriers enter the channel from the source and leave through the drain. The gate controls the channel conductivity. In many cases, the gate draws very little current, which is one reason FETs are so useful in electronic circuits.
Structure and terminals
The channel is a narrow region of semiconductor connecting source and drain. The gate is placed so that its electric field can change the number of charge carriers in this channel. If the channel becomes more conductive, the drain current increases. If the channel becomes less conductive, the drain current decreases.
In circuit symbols and descriptions, two voltages are especially important. The gate to source voltage is written as $V_{GS}$, and the drain to source voltage is written as $V_{DS}$. The current flowing from drain to source is written as $I_D$.
The essential control idea of a FET is:
A change in $V_{GS}$ changes the channel conductivity, which changes the drain current $I_D$.
Main types of field effect transistors
There are two very important families of FETs, the junction FET, or JFET, and the metal oxide semiconductor FET, or MOSFET. Both use an electric field to control current, but they do so in different ways.
JFET
In a JFET, the gate forms a reverse biased junction with the channel. This reverse bias changes the width of a depletion region inside the semiconductor. As the depletion region grows, the channel becomes narrower, so current decreases.
A JFET can be thought of as having a channel that already exists when no gate voltage is applied. The gate voltage then squeezes the channel and reduces current.
MOSFET
In a MOSFET, the gate is insulated from the semiconductor by a very thin oxide layer. Because of this insulation, gate current is extremely small. The electric field from the gate can create or modify a conducting channel between source and drain.
MOSFETs are the most common transistors in modern electronics. They are used in digital logic, amplifiers, switching circuits, and integrated circuits.
n-channel and p-channel devices
FETs can be made as n-channel or p-channel devices. The names tell us which type of charge carrier mainly moves through the channel.
For an n-channel FET, the current is mainly carried by electrons. For a p-channel FET, the current is mainly carried by holes. In practice, n-channel devices are often preferred because electrons usually move more easily through the semiconductor than holes, giving higher performance.
| Type | Main carriers | Typical control tendency |
|---|---|---|
| n-channel | Electrons | Positive $V_{GS}$ usually increases conduction in enhancement MOSFETs |
| p-channel | Holes | Negative $V_{GS}$ usually increases conduction in enhancement MOSFETs |
Enhancement and depletion behavior
A useful way to classify FETs, especially MOSFETs, is by asking what happens when the gate voltage is zero.
In an enhancement mode MOSFET, there is no strong conducting channel at $V_{GS}=0$. The gate voltage must first create the channel. For an n-channel enhancement MOSFET, making the gate positive relative to the source attracts electrons and forms a conductive path.
In a depletion mode device, a channel already exists at zero gate voltage. Applying the proper gate voltage reduces the channel conductivity and may eventually turn the device off.
Enhancement mode means the gate voltage creates or strengthens the channel.
Depletion mode means the channel already exists and the gate voltage can weaken it.
MOSFET operation
Because MOSFETs are so important, it is helpful to understand their operation at a basic level. Consider an n-channel enhancement MOSFET. When $V_{GS}$ is small, the device is off and almost no drain current flows. As $V_{GS}$ increases, electrons gather near the semiconductor surface under the gate. Once a certain gate voltage is reached, a conducting channel forms. This special voltage is called the threshold voltage, written $V_T$.
If $V_{GS} > V_T$, the device can conduct. Then the amount of current also depends on $V_{DS}$.
Operating regions
For a MOSFET, the drain current changes differently in different operating regions. At a beginner level, the most important regions are cutoff, linear region, and saturation region.
In cutoff, the gate voltage is too small to form a channel, so the transistor is effectively off.
In the linear region, also called the ohmic region, the channel exists and the transistor behaves somewhat like a controlled resistor.
In saturation, the current becomes much less dependent on $V_{DS}$ and is controlled mainly by $V_{GS}$. This region is very important for amplification.
For an ideal n-channel enhancement MOSFET, the regions are often summarized as follows:
| Region | Condition | Behavior |
|---|---|---|
| Cutoff | $V_{GS} < V_T$ | Very small current |
| Linear | $V_{GS} > V_T$ and $V_{DS} < V_{GS} - V_T$ | Current rises with $V_{DS}$ |
| Saturation | $V_{GS} > V_T$ and $V_{DS} \ge V_{GS} - V_T$ | Current mainly set by $V_{GS}$ |
For an ideal n-channel enhancement MOSFET:
Cutoff: $V_{GS} < V_T$
Saturation begins when: $V_{DS} = V_{GS} - V_T$
Current equations
A full treatment belongs in more advanced electronics, but a simple model is very useful. In saturation, the drain current of an ideal MOSFET is often written as
$$
I_D = k(V_{GS} - V_T)^2
$$
where $k$ is a constant that depends on the device.
This equation shows an important point. The current depends strongly on how far the gate voltage is above threshold. A small change in gate voltage can cause a large change in drain current.
In the linear region, a simple model is
$$
I_D = k\left[2(V_{GS} - V_T)V_{DS} - V_{DS}^2\right]
$$
These formulas are idealized, but they capture the basic behavior.
Why FETs are useful
FETs are popular because they can be controlled by voltage and usually require very little input current. This gives them high input resistance, especially MOSFETs. Because the gate current is tiny, the control circuit does not need to supply much power.
This makes FETs excellent for integrated circuits, where millions or billions of transistors may be placed on one chip. They are also useful as electronic switches. A MOSFET can be driven into cutoff for an off state or into strong conduction for an on state.
FETs as switches and amplifiers
A FET can work in two very common ways. In switching applications, the transistor is driven either off or on. This is the basis of digital electronics. In amplifier applications, the transistor is biased in a region where small changes in gate voltage cause changes in drain current. That changing current can then produce a larger voltage change elsewhere in the circuit.
The details of amplifier circuits belong to other chapters, but the key transistor idea is simple. The FET allows a small controlling voltage at the gate to regulate a larger current through the drain source path.
Comparison with bipolar junction transistors
A short comparison helps place FETs in context.
| Feature | FET | BJT |
|---|---|---|
| Control type | Voltage controlled | Current controlled |
| Input current | Very small | Larger than FET |
| Main carriers | Usually one type | Both electrons and holes |
| Input resistance | High | Lower than FET |
This is why MOSFETs dominate digital electronics, while BJTs are still important in many analog and special purpose circuits.
Practical ideas
Real FETs are not perfectly ideal. Threshold voltage varies from one device to another. The current in saturation is not completely constant with changing $V_{DS}$. Also, MOSFET gates can be damaged by static electric charge because the oxide layer is very thin. So in practice, careful handling is needed.
Another practical point is that the names source and drain are defined by how the device is used in a circuit, but in many MOSFET structures they are physically similar. The applied voltages determine the actual current direction.
Important practical facts:
MOSFET gates draw very little current.
MOSFET gates can be sensitive to electrostatic discharge.
Threshold voltage $V_T$ is a key parameter that determines when conduction begins.
Summary
A field effect transistor controls current by using an electric field to change the conductivity of a semiconductor channel. Its main terminals are source, drain, and gate. JFETs control a pre existing channel by reverse biasing a junction, while MOSFETs use an insulated gate to create or control a channel. FETs may be n-channel or p-channel, and MOSFETs may be enhancement mode or depletion mode. Their high input resistance and easy voltage control make them fundamental building blocks of modern electronics.
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- ☰ 2.6. Gravitation
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- ☰ 2.6.4. Planetary Motion
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- ☰ 3. Part II: Oscillations, Waves, and Fluids
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- ☰ 3.2. Mechanical Waves
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- ☰ 3.2.2. Mathematical Description of Waves
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- ☰ 3.2.3. Superposition
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- ☰ 3.2.4. Standing Waves
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- ☰ 3.2.5. Sound Waves
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- ☰ 3.3. Fluid Mechanics
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- ☰ 3.3.2. Fluid Statics
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- ☰ 3.3.3. Buoyancy
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- ☰ 3.3.4. Fluid Dynamics
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- ☰ 3.3.5. Viscosity
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- ☰ 4. Part III: Thermodynamics
- ☰ 4.1. Temperature and Heat
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- ☰ 4.2. Kinetic Theory of Gases
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- ☰ 4.3. Thermodynamics
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- ☰ 5. Part IV: Electricity and Magnetism
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- ☰ 5.1.1. Electric Charge
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- ☰ 5.2. Electric Potential
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- ☰ 5.2.5. Potential of Continuous Charge Distributions
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- ☰ 5.3. Capacitance
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- ☰ 5.3.4. Energy Stored in Capacitors
- ☰ 5.3.5. Dielectrics
- ☰ 5.3.6. Polarization
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- ☰ 5.4. Electric Current and Resistance
- ☰ 5.4.1. Electric Current
- ☰ 5.4.2. Current Density
- ☰ 5.4.3. Drift Velocity
- ☰ 5.4.4. Resistance
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- ☰ 5.4.8. Electric Power
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- ☰ 5.5. DC Circuits
- ☰ 5.5.1. Kirchhoff's Laws
- ☰ 5.5.2. Multi-Loop Circuits
- ☰ 5.5.3. RC Circuits
- ☰ 5.5.4. Measuring Instruments
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- ☰ 5.6. Magnetism
- ☰ 5.6.1. Magnetic Fields
- ☰ 5.6.2. Lorentz Force
- ☰ 5.6.3. Motion of Charged Particles
- ☰ 5.6.4. Force on Current-Carrying Wires
- ☰ 5.6.5. Torque on Current Loops
- ☰ 5.6.6. Biot-Savart Law
- ☰ 5.6.7. Ampère's Law
- ☰ 5.6.8. Solenoids
- ☰ 5.6.9. Magnetic Materials
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- ☰ 5.7. Electromagnetic Induction
- ☰ 5.7.1. Magnetic Flux
- ☰ 5.7.2. Faraday's Law
- ☰ 5.7.3. Lenz's Law
- ☰ 5.7.4. Motional EMF
- ☰ 5.7.5. Self-Inductance
- ☰ 5.7.6. Mutual Inductance
- ☰ 5.7.7. RL Circuits
- ☰ 5.7.8. LC Oscillations
-
- ☰ 5.8. Alternating Current
- ☰ 5.8.1. AC Voltage and Current
- ☰ 5.8.2. RMS Quantities
- ☰ 5.8.3. Resistors in AC Circuits
- ☰ 5.8.4. Capacitors in AC Circuits
- ☰ 5.8.5. Inductors in AC Circuits
- ☰ 5.8.6. RLC Circuits
- ☰ 5.8.7. Impedance
- ☰ 5.8.8. Resonance
- ☰ 5.8.9. Transformers
-
- ☰ 5.9. Maxwell's Equations and Electromagnetic Waves
- ☰ 5.9.1. Gauss's Law for Electricity
- ☰ 5.9.2. Gauss's Law for Magnetism
- ☰ 5.9.3. Faraday's Law
- ☰ 5.9.4. Ampère-Maxwell Law
- ☰ 5.9.5. Electromagnetic Waves
- ☰ 5.9.6. Speed of Light
- ☰ 5.9.7. Electromagnetic Spectrum
- ☰ 5.9.8. Poynting Vector
- ☰ 5.9.9. Radiation Pressure
-
-
- ☰ 6. Part V: Optics
- ☰ 6.1. Geometrical Optics
- ☰ 6.1.1. Nature of Light
- ☰ 6.1.2. Reflection
- ☰ 6.1.3. Plane Mirrors
- ☰ 6.1.4. Refraction
- ☰ 6.1.5. Snell's Law
- ☰ 6.1.6. Total Internal Reflection
- ☰ 6.1.7. Spherical Mirrors
- ☰ 6.1.8. Thin Lenses
- ☰ 6.1.9. Mirror Equation
- ☰ 6.1.10. Lens Equation
- ☰ 6.1.11. Magnification
- ☰ 6.1.12. Ray Diagrams
- ☰ 6.1.13. Optical Instruments
-
- ☰ 6.2. Wave Optics
- ☰ 6.2.1. Interference
- ☰ 6.2.2. Young's Double-Slit Experiment
- ☰ 6.2.3. Diffraction
- ☰ 6.2.4. Single-Slit Diffraction
- ☰ 6.2.5. Diffraction Gratings
- ☰ 6.2.6. Polarization
- ☰ 6.2.7. Malus's Law
- ☰ 6.2.8. Brewster's Angle
- ☰ 6.2.9. Rayleigh Criterion
- ☰ 6.2.10. Optical Resolution
-
-
- ☰ 7. Part VI: Modern Physics
- ☰ 7.1. Special Relativity
- ☰ 7.1.1. Galilean Relativity
- ☰ 7.1.2. Michelson-Morley Experiment
- ☰ 7.1.3. Einstein's Postulates
- ☰ 7.1.4. Lorentz Transformations
- ☰ 7.1.5. Relativity of Simultaneity
- ☰ 7.1.6. Time Dilation
- ☰ 7.1.7. Length Contraction
- ☰ 7.1.8. Relativistic Velocity Addition
- ☰ 7.1.9. Relativistic Momentum
- ☰ 7.1.10. Relativistic Energy
- ☰ 7.1.11. Mass-Energy Equivalence
- ☰ 7.1.12. Energy-Momentum Relation
- ☰ 7.1.13. Spacetime Diagrams
- ☰ 7.1.14. Light Cones
-
- ☰ 7.2. Introduction to Quantum Physics
- ☰ 7.2.1. Blackbody Radiation
- ☰ 7.2.2. Planck's Hypothesis
- ☰ 7.2.3. Photoelectric Effect
- ☰ 7.2.4. Photon Energy
- ☰ 7.2.5. Photon Momentum
- ☰ 7.2.6. Compton Scattering
- ☰ 7.2.7. de Broglie Wavelength
- ☰ 7.2.8. Matter Waves
- ☰ 7.2.9. Wave-Particle Duality
- ☰ 7.2.10. Double-Slit Experiment
- ☰ 7.2.11. Heisenberg Uncertainty Principle
-
- ☰ 7.3. Quantum Mechanics
- ☰ 7.3.1. Wave Function
- ☰ 7.3.2. Probability Interpretation
- ☰ 7.3.3. Normalization
- ☰ 7.3.4. Schrödinger Equation
- ☰ 7.3.5. Operators and Observables
- ☰ 7.3.6. Expectation Values
- ☰ 7.3.7. Particle in a Box
- ☰ 7.3.8. Finite Potential Wells
- ☰ 7.3.9. Quantum Tunneling
- ☰ 7.3.10. Quantum Harmonic Oscillator
- ☰ 7.3.11. Hydrogen Atom
- ☰ 7.3.12. Quantum Numbers
- ☰ 7.3.13. Angular Momentum
- ☰ 7.3.14. Spin
- ☰ 7.3.15. Stern-Gerlach Experiment
- ☰ 7.3.16. Pauli Exclusion Principle
-
- ☰ 7.4. Atomic Physics
- ☰ 7.4.1. Thomson Atomic Model
- ☰ 7.4.2. Rutherford Atomic Model
- ☰ 7.4.3. Bohr Model
- ☰ 7.4.4. Atomic Spectra
- ☰ 7.4.5. Hydrogen Spectrum
- ☰ 7.4.6. Electron Shells
- ☰ 7.4.7. Orbitals
- ☰ 7.4.8. Electron Configurations
- ☰ 7.4.9. X-Ray Spectra
- ☰ 7.4.10. Atomic Transitions
- ☰ 7.4.11. Lasers
- ☰ 7.4.12. Stimulated Emission
-
-
- ☰ 8. Part VII: Nuclear and Particle Physics
- ☰ 8.1. Nuclear Structure
- ☰ 8.1.1. The Atomic Nucleus
- ☰ 8.1.1.1. Protons and Neutrons
- ☰ 8.1.1.2. Atomic Number
- ☰ 8.1.1.3. Mass Number
- ☰ 8.1.1.4. Isotopes
- ☰ 8.1.1.5. Isotones
- ☰ 8.1.1.6. Isobars
-
- ☰ 8.1.2. Nuclear Size and Density
- ☰ 8.1.2.1. Nuclear Radius
- ☰ 8.1.2.2. Nuclear Density
- ☰ 8.1.2.3. Nuclear Charge Distribution
-
- ☰ 8.1.3. Nuclear Forces
- ☰ 8.1.3.1. Strong Nuclear Force
- ☰ 8.1.3.2. Properties of Nuclear Forces
- ☰ 8.1.3.3. Proton-Neutron Interaction
- ☰ 8.1.3.4. Nuclear Stability
-
- ☰ 8.1.4. Mass and Binding Energy
- ☰ 8.1.4.1. Atomic Mass Units
- ☰ 8.1.4.2. Mass Defect
- ☰ 8.1.4.3. Binding Energy
- ☰ 8.1.4.4. Binding Energy per Nucleon
- ☰ 8.1.4.5. Binding-Energy Curve
-
- ☰ 8.1.5. Nuclear Models
- ☰ 8.1.5.1. Liquid-Drop Model
- ☰ 8.1.5.2. Semi-Empirical Mass Formula
- ☰ 8.1.5.3. Nuclear Shell Model
- ☰ 8.1.5.4. Magic Numbers
- ☰ 8.1.5.5. Collective Model
-
- ☰ 8.1.6. Nuclear Spin and Magnetic Moments
- ☰ 8.1.6.1. Nuclear Angular Momentum
- ☰ 8.1.6.2. Nuclear Spin
- ☰ 8.1.6.3. Nuclear Magnetic Moment
-
-
- ☰ 8.2. Radioactivity and Nuclear Decay
- ☰ 8.2.1. Radioactive Decay
- ☰ 8.2.1.1. Nuclear Instability
- ☰ 8.2.1.2. Random Nature of Decay
- ☰ 8.2.1.3. Decay Constant
-
- ☰ 8.2.2. Radioactive Decay Law
- ☰ 8.2.2.1. Exponential Decay
- ☰ 8.2.2.2. Activity
- ☰ 8.2.2.3. Half-Life
- ☰ 8.2.2.4. Mean Lifetime
-
- ☰ 8.2.3. Alpha Decay
- ☰ 8.2.3.1. Alpha Particles
- ☰ 8.2.3.2. Energy of Alpha Decay
-
- ☰ 8.2.4. Beta Decay
- ☰ 8.2.4.1. Beta-Minus Decay
- ☰ 8.2.4.2. Beta-Plus Decay
- ☰ 8.2.4.3. Electron Capture
- ☰ 8.2.4.4. Neutrinos
- ☰ 8.2.4.5. Energy Spectrum
-
- ☰ 8.2.5. Gamma Decay
- ☰ 8.2.5.1. Nuclear Excited States
- ☰ 8.2.5.2. Gamma-Ray Emission
- ☰ 8.2.5.3. Internal Conversion
-
- ☰ 8.2.6. Decay Chains
- ☰ 8.2.6.1. Parent and Daughter Nuclei
- ☰ 8.2.6.2. Secular Equilibrium
- ☰ 8.2.6.3. Natural Radioactive Series
-
-
- ☰ 8.3. Interaction of Radiation with Matter
- ☰ 8.3.1. Charged Particle Interactions
- ☰ 8.3.1.1. Ionization
- ☰ 8.3.1.2. Excitation
- ☰ 8.3.1.3. Energy Loss
- ☰ 8.3.1.4. Stopping Power
- ☰ 8.3.1.5. Range
-
- ☰ 8.3.2. Heavy Charged Particles
- ☰ 8.3.2.1. Alpha Particles
- ☰ 8.3.2.2. Bragg Curve
- ☰ 8.3.2.3. Bragg Peak
-
- ☰ 8.3.3. Electron Interactions
- ☰ 8.3.3.1. Collisional Energy Loss
- ☰ 8.3.3.2. Bremsstrahlung
- ☰ 8.3.3.3. Electron Range
-
- ☰ 8.3.4. Photon Interactions
- ☰ 8.3.4.1. Pair Production
- ☰ 8.3.4.2. Rayleigh Scattering
-
- ☰ 8.3.5. Attenuation of Radiation
- ☰ 8.3.5.1. Linear Attenuation Coefficient
- ☰ 8.3.5.2. Mass Attenuation Coefficient
- ☰ 8.3.5.3. Exponential Attenuation
- ☰ 8.3.5.4. Half-Value Layer
-
- ☰ 8.3.6. Neutron Interactions
- ☰ 8.3.6.1. Elastic Scattering
- ☰ 8.3.6.2. Inelastic Scattering
- ☰ 8.3.6.3. Neutron Capture
- ☰ 8.3.6.4. Neutron Moderation
-
-
- ☰ 8.4. Radiation Detection and Measurement
- ☰ 8.4.1. Principles of Radiation Detection
- ☰ 8.4.1.1. Energy Deposition
- ☰ 8.4.1.2. Detector Efficiency
- ☰ 8.4.1.3. Energy Resolution
- ☰ 8.4.1.4. Timing Resolution
- ☰ 8.4.1.5. Dead Time
-
- ☰ 8.4.2. Gas-Filled Detectors
- ☰ 8.4.2.1. Ionization Chambers
- ☰ 8.4.2.2. Proportional Counters
- ☰ 8.4.2.3. Geiger-Müller Counters
-
- ☰ 8.4.3. Scintillation Detectors
- ☰ 8.4.3.1. Scintillation Process
- ☰ 8.4.3.2. Organic Scintillators
- ☰ 8.4.3.3. Inorganic Scintillators
- ☰ 8.4.3.4. Photomultiplier Tubes
- ☰ 8.4.3.5. Silicon Photomultipliers
-
- ☰ 8.4.4. Semiconductor Detectors
- ☰ 8.4.4.1. Silicon Detectors
- ☰ 8.4.4.2. Germanium Detectors
- ☰ 8.4.4.3. Electron-Hole Pair Creation
-
- ☰ 8.4.5. Gamma-Ray Spectroscopy
- ☰ 8.4.5.1. Photopeak
- ☰ 8.4.5.2. Compton Continuum
- ☰ 8.4.5.3. Compton Edge
- ☰ 8.4.5.4. Escape Peaks
-
- ☰ 8.4.6. Coincidence Measurements
- ☰ 8.4.6.1. Coincidence Detection
- ☰ 8.4.6.2. Timing Windows
- ☰ 8.4.6.3. True Coincidences
- ☰ 8.4.6.4. Random Coincidences
-
-
- ☰ 8.5. Nuclear Reactions
- ☰ 8.5.1. Principles of Nuclear Reactions
- ☰ 8.5.1.1. Reaction Notation
- ☰ 8.5.1.2. Conservation Laws
- ☰ 8.5.1.3. Reaction Energetics
-
- ☰ 8.5.2. Q-Value
- ☰ 8.5.2.1. Exothermic Reactions
- ☰ 8.5.2.2. Endothermic Reactions
- ☰ 8.5.2.3. Reaction Thresholds
-
- ☰ 8.5.3. Reaction Cross Section
- ☰ 8.5.3.1. Cross Section
- ☰ 8.5.3.2. Reaction Probability
- ☰ 8.5.3.3. Energy Dependence
-
- ☰ 8.5.4. Types of Nuclear Reactions
- ☰ 8.5.4.1. Elastic Scattering
- ☰ 8.5.4.2. Inelastic Scattering
- ☰ 8.5.4.3. Capture Reactions
- ☰ 8.5.4.4. Transfer Reactions
- ☰ 8.5.4.5. Charge-Exchange Reactions
-
- ☰ 8.5.5. Compound Nucleus
- ☰ 8.5.5.1. Formation
- ☰ 8.5.5.2. Decay Channels
- ☰ 8.5.5.3. Resonances
-
-
- ☰ 8.6. Nuclear Fission and Fusion
- ☰ 8.6.1. Nuclear Fission
- ☰ 8.6.1.1. Fission Process
- ☰ 8.6.1.2. Fission Fragments
- ☰ 8.6.1.3. Energy Release
- ☰ 8.6.1.4. Neutron Production
-
- ☰ 8.6.2. Chain Reactions
- ☰ 8.6.2.1. Criticality
- ☰ 8.6.2.2. Multiplication Factor
- ☰ 8.6.2.3. Critical Mass
-
- ☰ 8.6.3. Nuclear Reactors
- ☰ 8.6.3.1. Reactor Components
- ☰ 8.6.3.2. Fuel
- ☰ 8.6.3.3. Moderator
- ☰ 8.6.3.4. Control Rods
- ☰ 8.6.3.5. Coolant
-
- ☰ 8.6.4. Nuclear Fusion
- ☰ 8.6.4.1. Fusion Reactions
- ☰ 8.6.4.2. Coulomb Barrier
-
- ☰ 8.6.5. Stellar Fusion
- ☰ 8.6.5.1. Proton-Proton Chain
- ☰ 8.6.5.2. CNO Cycle
- ☰ 8.6.5.3. Nucleosynthesis
-
- ☰ 8.6.6. Controlled Fusion
- ☰ 8.6.6.1. Magnetic Confinement
- ☰ 8.6.6.2. Tokamaks
- ☰ 8.6.6.3. Inertial Confinement
-
-
- ☰ 8.7. Particle Physics Foundations
- ☰ 8.7.1. From Atoms to Elementary Particles
- ☰ 8.7.1.1. Discovery of the Electron
- ☰ 8.7.1.2. Discovery of the Nucleus
- ☰ 8.7.1.3. Discovery of the Neutron
- ☰ 8.7.1.4. Discovery of Antimatter
-
- ☰ 8.7.2. Classification of Particles
- ☰ 8.7.2.1. Elementary Particles
- ☰ 8.7.2.2. Composite Particles
- ☰ 8.7.2.3. Fermions
- ☰ 8.7.2.4. Bosons
-
- ☰ 8.7.3. Antiparticles
- ☰ 8.7.3.1. Matter and Antimatter
- ☰ 8.7.3.2. Pair Production
- ☰ 8.7.3.3. Annihilation
-
- ☰ 8.7.4. Relativistic Particle Kinematics
- ☰ 8.7.4.1. Four-Momentum
- ☰ 8.7.4.2. Invariant Mass
-
- ☰ 8.7.5. Particle Decays
- ☰ 8.7.5.1. Decay Width
- ☰ 8.7.5.2. Lifetime
- ☰ 8.7.5.3. Branching Ratio
- ☰ 8.7.5.4. Conservation Laws
-
-
- ☰ 8.8. Quarks and Hadrons
- ☰ 8.8.1. Quarks
- ☰ 8.8.1.1. Up Quark
- ☰ 8.8.1.2. Down Quark
- ☰ 8.8.1.3. Strange Quark
- ☰ 8.8.1.4. Charm Quark
- ☰ 8.8.1.5. Top Quark
- ☰ 8.8.1.6. Bottom Quark
-
- ☰ 8.8.2. Quark Properties
- ☰ 8.8.2.1. Mass
- ☰ 8.8.2.2. Flavor
- ☰ 8.8.2.3. Color Charge
-
- ☰ 8.8.3. Hadrons
- ☰ 8.8.3.1. Baryons
- ☰ 8.8.3.2. Mesons
-
- ☰ 8.8.4. Baryon Structure
- ☰ 8.8.4.1. Proton Quark Structure
- ☰ 8.8.4.2. Neutron Quark Structure
- ☰ 8.8.4.3. Other Baryons
-
- ☰ 8.8.5. Meson Structure
- ☰ 8.8.5.1. Pions
- ☰ 8.8.5.2. Kaons
- ☰ 8.8.5.3. Heavy Mesons
-
- ☰ 8.8.6. Confinement
- ☰ 8.8.6.1. Color Confinement
- ☰ 8.8.6.2. Hadronization
- ☰ 8.8.6.3. Jets
-
-
- ☰ 8.9. Leptons and Neutrinos
- ☰ 8.9.1. Charged Leptons
- ☰ 8.9.1.1. Electron
- ☰ 8.9.1.2. Muon
- ☰ 8.9.1.3. Tau
-
- ☰ 8.9.2. Neutrinos
- ☰ 8.9.2.1. Electron Neutrino
- ☰ 8.9.2.2. Muon Neutrino
- ☰ 8.9.2.3. Tau Neutrino
-
- ☰ 8.9.3. Neutrino Interactions
- ☰ 8.9.3.1. Weak Interactions
- ☰ 8.9.3.2. Neutrino Detection
-
- ☰ 8.9.4. Neutrino Oscillations
- ☰ 8.9.4.1. Neutrino Flavor
- ☰ 8.9.4.2. Flavor Oscillation
- ☰ 8.9.4.3. Neutrino Mass
-
-
- ☰ 8.10. Fundamental Interactions
- ☰ 8.10.1. Four Fundamental Interactions
- ☰ 8.10.1.1. Electromagnetism
- ☰ 8.10.1.2. Strong Interaction
- ☰ 8.10.1.3. Weak Interaction
-
- ☰ 8.10.2. Exchange Particles
- ☰ 8.10.2.1. Photons
- ☰ 8.10.2.2. Gluons
- ☰ 8.10.2.3. W Bosons
- ☰ 8.10.2.4. Z Boson
-
- ☰ 8.10.3. Electromagnetic Interaction
- ☰ 8.10.3.1. Photon Exchange
-
- ☰ 8.10.4. Strong Interaction
- ☰ 8.10.4.1. Color Charge
- ☰ 8.10.4.2. Gluons
- ☰ 8.10.4.3. Quantum Chromodynamics
-
- ☰ 8.10.5. Weak Interaction
- ☰ 8.10.5.1. Beta Decay
- ☰ 8.10.5.2. W and Z Bosons
- ☰ 8.10.5.3. Flavor-Changing Processes
-
-
- ☰ 8.11. The Standard Model
- ☰ 8.11.1. Overview of the Standard Model
- ☰ 8.11.1.1. Matter Particles
- ☰ 8.11.1.2. Force Carriers
- ☰ 8.11.1.3. Particle Generations
-
- ☰ 8.11.2. Fermions
- ☰ 8.11.2.1. Quarks
- ☰ 8.11.2.2. Leptons
-
- ☰ 8.11.3. Gauge Bosons
- ☰ 8.11.3.1. Photon
- ☰ 8.11.3.2. Gluons
- ☰ 8.11.3.3. W Bosons
- ☰ 8.11.3.4. Z Boson
-
- ☰ 8.11.4. Higgs Field and Higgs Boson
- ☰ 8.11.4.1. Higgs Field
- ☰ 8.11.4.2. Spontaneous Symmetry Breaking
- ☰ 8.11.4.3. Particle Masses
- ☰ 8.11.4.4. Higgs Boson
-
- ☰ 8.11.5. Standard Model Interactions
- ☰ 8.11.5.1. Electroweak Theory
- ☰ 8.11.5.2. Quantum Chromodynamics
-
- ☰ 8.11.6. Limitations of the Standard Model
- ☰ 8.11.6.1. Gravity
- ☰ 8.11.6.2. Dark Matter
- ☰ 8.11.6.3. Neutrino Masses
- ☰ 8.11.6.4. Matter-Antimatter Asymmetry
-
-
- ☰ 8.12. Symmetries and Conservation Laws
- ☰ 8.12.1. Conservation Laws
- ☰ 8.12.1.1. Energy
-
- ☰ 8.12.2. Particle Quantum Numbers
- ☰ 8.12.2.1. Baryon Number
- ☰ 8.12.2.2. Lepton Number
- ☰ 8.12.2.3. Strangeness
- ☰ 8.12.2.4. Charm
- ☰ 8.12.2.5. Isospin
-
- ☰ 8.12.3. Symmetries
- ☰ 8.12.3.1. Charge Conjugation
- ☰ 8.12.3.2. Parity
- ☰ 8.12.3.3. Time Reversal
-
- ☰ 8.12.4. CP Symmetry
- ☰ 8.12.4.1. CP Conservation
- ☰ 8.12.4.2. CP Violation
- ☰ 8.12.4.3. Matter-Antimatter Asymmetry
-
-
- ☰ 8.13. Particle Accelerators
- ☰ 8.13.1. Principles of Acceleration
- ☰ 8.13.1.1. Electric-Field Acceleration
- ☰ 8.13.1.2. Magnetic-Field Steering
-
- ☰ 8.13.2. Linear Accelerators
- ☰ 8.13.2.1. LINACs
- ☰ 8.13.2.2. Radio-Frequency Acceleration
-
- ☰ 8.13.3. Cyclotrons
- ☰ 8.13.3.1. Cyclotron Principle
- ☰ 8.13.3.2. Cyclotron Frequency
- ☰ 8.13.3.3. Limitations
-
- ☰ 8.13.4. Synchrotrons
- ☰ 8.13.4.1. Circular Accelerators
- ☰ 8.13.4.2. Magnetic Focusing
- ☰ 8.13.4.3. RF Cavities
-
- ☰ 8.13.5. Colliders
- ☰ 8.13.5.1. Fixed-Target Experiments
- ☰ 8.13.5.2. Collider Experiments
- ☰ 8.13.5.3. Center-of-Mass Energy
-
- ☰ 8.13.6. Major Particle Accelerators
- ☰ 8.13.6.1. Large Hadron Collider
- ☰ 8.13.6.2. Electron-Positron Colliders
- ☰ 8.13.6.3. Heavy-Ion Colliders
-
-
- ☰ 8.14. Particle Detectors
- ☰ 8.14.1. Principles of Particle Detection
- ☰ 8.14.1.1. Ionization
- ☰ 8.14.1.2. Excitation
- ☰ 8.14.1.3. Energy Deposition
- ☰ 8.14.1.4. Particle Identification
-
- ☰ 8.14.2. Tracking Detectors
- ☰ 8.14.2.1. Cloud Chambers
- ☰ 8.14.2.2. Bubble Chambers
- ☰ 8.14.2.3. Wire Chambers
- ☰ 8.14.2.4. Silicon Trackers
-
- ☰ 8.14.3. Calorimeters
- ☰ 8.14.3.1. Electromagnetic Calorimeters
- ☰ 8.14.3.2. Hadronic Calorimeters
- ☰ 8.14.3.3. Shower Development
-
- ☰ 8.14.4. Cherenkov Detectors
- ☰ 8.14.4.1. Cherenkov Radiation
- ☰ 8.14.4.2. Particle Velocity Measurement
-
- ☰ 8.14.5. Time-of-Flight Detectors
- ☰ 8.14.5.1. Timing Measurements
- ☰ 8.14.5.2. Particle Identification
-
- ☰ 8.14.6. Modern Detector Systems
- ☰ 8.14.6.1. Tracking
- ☰ 8.14.6.2. Muon Systems
- ☰ 8.14.6.3. Trigger Systems
-
-
-
- ☰ 9. Part VIII: Condensed Matter and Applied Physics
- ☰ 9.1. Solid-State Physics
- ☰ 9.1.1. Crystal Structure
- ☰ 9.1.1.1. Crystal Lattices
- ☰ 9.1.1.2. Unit Cells
- ☰ 9.1.1.3. Bravais Lattices
-
- ☰ 9.1.2. Electronic Properties
- ☰ 9.1.2.1. Energy Bands
- ☰ 9.1.2.2. Conductors
- ☰ 9.1.2.3. Insulators
- ☰ 9.1.2.4. Semiconductors
-
- ☰ 9.1.3. Semiconductor Physics
- ☰ 9.1.3.1. Intrinsic Semiconductors
- ☰ 9.1.3.2. Doping
- ☰ 9.1.3.3. p-Type Materials
- ☰ 9.1.3.4. n-Type Materials
- ☰ 9.1.3.5. p-n Junctions
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- ☰ 9.1.4. Superconductivity
- ☰ 9.1.4.1. Zero Resistance
- ☰ 9.1.4.2. Meissner Effect
- ☰ 9.1.4.3. Critical Temperature
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- ☰ 9.2. Electronics
- ☰ 9.2.1. Semiconductor Diodes
- ☰ 9.2.1.1. p-n Junction
- ☰ 9.2.1.2. Diode Characteristics
- ☰ 9.2.1.3. Rectifiers
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- ☰ 9.2.2. Transistors
- ☰ 9.2.2.1. Bipolar Junction Transistors
- ☰ 9.2.2.2. Field-Effect Transistors
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- ☰ 9.2.3. Operational Amplifiers
- ☰ 9.2.3.1. Ideal Op-Amp
- ☰ 9.2.3.2. Amplifiers
- ☰ 9.2.3.3. Comparators
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- ☰ 9.2.4. Digital Electronics
- ☰ 9.2.4.1. Binary Numbers
- ☰ 9.2.4.2. Logic Gates
- ☰ 9.2.4.3. Boolean Algebra
- ☰ 9.2.4.4. Basic Digital Circuits
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- ☰ 10. Part IX: Astrophysics and Cosmology
- ☰ 10.1. Astrophysics
- ☰ 10.1.1. Measuring the Universe
- ☰ 10.1.1.1. Astronomical Distances
- ☰ 10.1.1.2. Parallax
- ☰ 10.1.1.3. Luminosity
- ☰ 10.1.1.4. Apparent Brightness
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- ☰ 10.1.2. Stars
- ☰ 10.1.2.1. Stellar Spectra
- ☰ 10.1.2.2. Hertzsprung-Russell Diagram
- ☰ 10.1.2.3. Stellar Evolution
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- ☰ 10.1.3. Stellar Remnants
- ☰ 10.1.3.1. White Dwarfs
- ☰ 10.1.3.2. Neutron Stars
- ☰ 10.1.3.3. Black Holes
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- ☰ 10.1.4. Galaxies
- ☰ 10.1.4.1. Structure of Galaxies
- ☰ 10.1.4.2. Milky Way
- ☰ 10.1.4.3. Galaxy Classification
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- ☰ 10.2. Cosmology
- ☰ 10.2.1. Expanding Universe
- ☰ 10.2.1.1. Hubble's Law
- ☰ 10.2.1.2. Cosmological Redshift
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- ☰ 10.2.2. Big Bang Cosmology
- ☰ 10.2.2.1. Early Universe
- ☰ 10.2.2.2. Cosmic Microwave Background
- ☰ 10.2.2.3. Primordial Nucleosynthesis
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- ☰ 10.2.3. Dark Matter
- ☰ 10.2.3.1. Evidence for Dark Matter
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